TODAY’S PATENT – HIGH-RESOLUTION SCANNING MICROSCOPY

The said invention (US9470883B2) was invented by Thomas KALKBRENNER, Ingo Kleppe, Helmut Lippert, and Ralf Netz on 19^th September 2013. Currently; it stands assigned to Carl Zeiss Microscopy Gmb.

The invention describes a high-resolution scanning microscope that enhances resolution beyond the diffraction limit. It scans a point or linear spot over a sample, creating a diffraction-limited image in a detection plane. A detector captures the image with twice the spatial accuracy of the diffraction-limited image, while a wavefront sensor evaluates the sample’s effect on light phase and amplitude to improve resolution.

Traditional detectors like CCDs and CMOS struggle with pixel size and signal-to-noise limitations for high-resolution imaging. This microscope overcomes these issues by analyzing the diffraction structure for higher accuracy. Additionally, methods like PALM use activated marking molecules to precisely locate them, further boosting imaging resolution.