TODAY’S PATENT – MICROMETER

The MICROMETER was invented by  Masamichi Suzuki (Kanagawa), Shuuji Hayashida (Kanagawa), Seigo Takahashi (Kanagawa) on the 17^th of July 2001 , bearing patent number US6260286B1.

The present invention relates to a micrometer of a digital display type. More particularly, the invention relates to a micrometer having a spindle that is displaced in the axial direction during rotation that intends cost reduction, operability improvement, and accuracy improvement.

The micrometer includes a structure wherein an outer sleeve and a thimble are provided on the frame side and the spindle side respectively, a main scale graduation is formed along the axial direction of the outer circumference of the outer sleeve, and an vernier scale graduation is formed along the outer circumference of the thimble. Main objective to provide a micrometer of a type wherein a spindle displaces in the axial direction during the rotation that high precision can be guaranteed over a long term while maintaining the advantages of cost reduction and operability.